smartWLI technology

 

advantages of high performance measuring technologies

 smartWLI

coherence scanning interferometer

smartWLI

interferometry objectives

smartWLI

 

 

 

 

 

 

 

 

 

 

 

  interferences of white light

smartWLI compact f5

spectral optimization for noise reduction

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HD-EPSI (high density-extended phase shift interferometry)

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HD-EPSI and comparison to the profile averaging

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profile averaging

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comparison between HD-EPSI and the profile averaging

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advantage of extreme fast prescans

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advanced algorithms for steep surface features

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samples for steep concave and convex surfaces

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firebolt, 5x objective 3d printed metal surface

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acceleration using decimation

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acceleration using ROIs (reduced areas of interest)

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point density and optical lateral resolution

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microscope image analysis compared to the 3d scanning

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practical tests of the system resolution

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comparison to tactile measurements

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sampling theorem / optical resolution

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scratches of an stylus instrument on an roughness standard

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correct measurement of tracible roughness standards

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smartSTITCH perfect scans of larger areas

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